A Psychometric View of Technology-based Assessments

Authors

Gloria Liou, Rose-Hulman Institute of TechnologyFollow
Cavan V. Bonner, Purdue University
Louis Tay, Purdue University

Document Type

Article

Publication Date

1-1-2022

DOI Number / ISBN

10.1080/15305058.2022.2070757

External Access URL

https://doi.org/10.1080/15305058.2022.2070757

Recommended Citation

Liou, G., Bonner, C. V., & Tay, L. (2022). A psychometric view of technology-based assessments. International Journal of Testing, 22(3-4), 216–242. https://doi.org/10.1080/15305058.2022.2070757