A Psychometric View of Technology-based Assessments
Document Type
Article
Publication Date
1-1-2022
DOI Number / ISBN
10.1080/15305058.2022.2070757
External Access URL
https://doi.org/10.1080/15305058.2022.2070757
Recommended Citation
Liou, G., Bonner, C. V., & Tay, L. (2022). A psychometric view of technology-based assessments. International Journal of Testing, 22(3-4), 216–242. https://doi.org/10.1080/15305058.2022.2070757
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