Analysis of kerogens and model compounds by time-of-flight secondary ion mass spectrometry

Authors

Sudipa Mitra-Kirtley, Rose-Hulman Institute of TechnologyFollow
Kyle Bake
Andrew Pomerantz
Xiaohu Lu
Peter Sjovall
Oliver Mullins

Document Type

Article

Publication Date

1-1-2021

DOI Number / ISBN

0.1016/j.fuel.2020.119373

External Access URL

https://doi.org/10.1016/j.fuel.2020.119373

Recommended Citation

Sjövall, P., Bake, K. D., Pomerantz, A. E., Lu, X., Mitra-Kirtley, S., & Mullins, O. C. (2021). Analysis of kerogens and model compounds by time-of-flight secondary ion mass spectrometry (TOF-SIMS). Fuel, 286. doi:https://doi.org/10.1016/j.fuel.2020.119373