Piezoresponse Force Microscopy Characterization of High Aspect Ratio Ferroelectric

Authors

Ashley Bernal, Rose-Hulman Institute of TechnologyFollow
N. Bassiri-Gharb

Document Type

Article

Publication Date

1-1-2012

External Access URL

https://aip.scitation.org/doi/abs/10.1063/1.4746075

Recommended Citation

Bernal, A., & Bassiri-Gharb, N. (2012). Piezoresponse force microscopy characterization of high aspect ratio ferroelectric nanostructures. Journal of Applied Physics, 112(5), 2055-2069. https://aip.scitation.org/doi/abs/10.1063/1.4746075