Fast Imaging of Partially Conductive Linear Cracks Using Impedance Data

Authors

Kurt Bryan, Rose-Hulman Institute of TechnologyFollow
J. Haugh
D. McCune

Document Type

Article

Publication Date

2006

DOI Number / ISBN

10.1088/0266-5611/22/4/013

External Access URL

http://iopscience.iop.org/article/10.1088/0266-5611/22/4/013?pageTitle=IOPscience

Recommended Citation

Bryan, K., Haugh, J., & McCune, D. (2006). Fast imaging of partially conductive linear cracks using impedance data. Inverse Problems, 22(4), 1337-1358. https://doi.org/ 10.1088/0266-5611/22/4/013