Micro X-Ray Fluorescence Imaging for Silicide Diffusion Coating Inspection

Authors

Edward Doering, Rose-Hulman Institute of TechnologyFollow
G. Havrilla

Document Type

Article

Publication Date

2003

DOI Number / ISBN

10.1063/1.1711669

External Access URL

http://aip.scitation.org/doi/pdf/10.1063/1.1711669

Recommended Citation

Doering, E.R., Havrilla, G.J., & Miller, T.C. (2004, February). Micro x-ray fluorescence imaging for silicide diffusion coating inspection. AIP Conference Proceedings, 700(1), 538-545. https://doi.org/10.1063/1.1711669