Geometric property estimation based on raman spetra measurement using machine learning

Authors

Michael Jo, Rose-Hulman Insitute of TechnologyFollow
Umberto Ravaioli, University of Illinois at Urbana-Champaign

Document Type

Conference Proceeding

Publication Date

2018

DOI Number / ISBN

10.1109/NMDC.2018.8605883

Recommended Citation

Jo, M. K., & Ravaioli, U. (2019). Geometric property estimation based on raman spetra measurement using machine learning. 2018 IEEE 13th Nanotechnology Materials and Devices Conference, NMDC 2018. Institute of Electrical and Electronics Engineers Inc. https://doi.org/10.1109/NMDC.2018.8605883