Surface Wrinkling: A Versatile Platform For Measuring Thin-Film Properties

Authors

Adam Nolte, Rose-Hulman Institute of TechnologyFollow
J.Y Chung
C.M. Stafford

Document Type

Conference Proceeding

Publication Date

1-1-2011

Recommended Citation

Chung, J.Y., Nolte, A. J., & Stafford, C.M. (2011). Surface wrinkling: A versatile platform for measuring thin-film properties. Advanced Materials, 23(3), 349-368. https://doi.org/10.1002/adma.201001759

DOI Number / ISBN

10.1002/adma.201001759

External Access URL

http://onlinelibrary.wiley.com/doi/10.1002/adma.201001759/full