"Surface Wrinkling: A Versatile Platform For Measuring Thin-Film Proper" by Adam Nolte, J.Y Chung et al.
 

Surface Wrinkling: A Versatile Platform For Measuring Thin-Film Properties

Document Type

Conference Proceeding

Publication Date

1-1-2011

DOI Number / ISBN

10.1002/adma.201001759

External Access URL

http://onlinelibrary.wiley.com/doi/10.1002/adma.201001759/full

Link to Full Text

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